PhotonMEADOW23

Session

Photon diagnostics for FELs and synchrotrons

Sep 14, 2023, 11:00 AM

Trieste, Italy

39. XFEL sub-10 nm focusing with 10^22 W/cm^2 intensity: wavefront corrected mirror and focus characterization

Jumpei Yamada (Osaka University & RIKEN SPring-8 Center)

9/14/23, 11:00 AM

Oral

We have developed a sub-10 nm focusing system to achieve an ultraintense X-ray laser field with 10^22 W/cm^2 intensity at SACLA. For the sub-10 nm focusing optics, an advanced KB (AKB) mirror system based on Wolter-type III geometry has been adopted. One of the remarkable challenges was the fabrication of steeply curved mirrors with radii of curvature of ~3 m with a shape accuracy of 1 nm. We...

1. X-ray Gas Monitor operation at European XFEL above 25 keV

Dr Theophilos Maltezopoulos (European XFEL)

9/14/23, 11:30 AM

Oral

X-ray Gas Monitors (XGMs) are operated at European XFEL for non-invasive single-shot pulse energy measurements and average beam position monitoring. The basic mechanism is photo-ionization of rare gas atoms. They are used for machine SASE tuning and for sorting single-shot experimental data according to the pulse energy. The XGMs were developed at DESY based on the specific requirements of...

24. Development of X-ray Ionization Beam Position Monitor for PAL-XFEL Soft X-ray

Dr HyoJung Hyun (Pohang Accelerator Laboratory)

9/14/23, 11:50 AM

Oral

The Pohang Accelerator Laboratory X-ray Free-Electron Laser (PAL-XFEL) operates hard X-ray and soft X-ray beamlines for scientific experiments with providing intense ultrashort X-ray pulses based on the self-amplified spontaneous emission (SASE) process. X-ray Free-Electron Laser is characterized by strong pulse-to-pulse fluctuations due to the SASE process. Thus, online photon diagnostics are...

20. Silicon Carbide ultra-thin membranes for X-ray beam position and intensity monitoring

Massimo Camarda (SenSiC GmbH), Dr Christoph Arrell (PSI)

9/14/23, 12:10 PM

Oral

In this work, the performances of thin (0.5um-10um) Silicon Carbide (SiC) membranes as in-line X-ray Beam Position Monitors (XBPM) for synchrotron beams presented and compared with commercial single- and poly-crystalline diamond ones. Results show that SiC devices can reach superior transparencies with respect to diamond, thanks to the realisation of <2um thick sensors, while allowing for much...