After nearly 3 decades of service to the international research community, the Elettra 3rd generation synchrotron source will be replaced by the new Elettra 2.0 diffraction limited storage ring source. The parameters of Elettra 2.0 will boost the spatial, energy, and temporal resolution of all imaging, scattering, and spectroscopic techniques allowing new methodologies for in situ and operando characterization.
Among the new hard-X-ray beamlines using in-vacuum undulators, µ-XRF will replace the current XRF beamline.
The great amend of this new beamline will be the higher X-ray brilliance and the new optical scheme providing a micrometric x-ray beam spot. Future studies probing lateral “heterogeneities” with a micrometric spatial resolution, impossible to achieve at the current beamline, will be possible at the μ-XRF beamline at Elettra 2.0.
The goal of the workshop is to present and discuss our upgrade plan. During this event our key users and colleagues from other facilities will highlight the present needs and future perspectives over diverse scientific domains, including modern technology, energy devices, environment, geology, cultural heritage, health, etc.
Challenges encountered in similar beamlines in other diffraction-limited synchrotron facilities will be discussed.
Scientific opportunities offered by the micrometric spatial resolution of X-ray fluorescence coupled with absorption spectroscopy, imaging, and other ancillary techniques will be illustrated, emphasizing the impact of the project on the XRF community.
We look forward to your participation either in person or in virtual mode, to share our vision and gather feedback from our scientific community in order to leverage our future state-of-the-art facility.
