Presentation materials
The European X-ray Free Electron Laser (XFEL) facility produces extremely intense and short X-ray pulses, where the diagnostics of the X-ray beam properties is of critical importance. Besides existing diagnostic components, utilization of a diamond sensor was proposed to achieve radiation hard, non-invasive beam position and pulse energy measurements for hard X-rays. In particular, at very...
Developments of cutting-edge X-ray detectors are largely driven by experiments at large photon science facilities, i.e. the synchrotron radiation sources and free-electron lasers (FELs) which enable a wealth of investigations in different subjects. At PSI, we develop hybrid X-ray detectors for these facilities as well as for the next-generation radiation sources, namely diffraction-limited...
Hard X-ray imaging techniques employing bright-field images, such as bright-field microscopy and in-line holography, offer the benefit of capturing a wide field of view without the need to scan the sample. However, the spatial resolution of these techniques has been limited by the numerical aperture (NA) of hard X-ray optics.
Advanced KB optics based on Wolter type-III geometry is highly...
The impact from optics on circular, elliptical, and inclined linear polarized light at synchrotron beamlines is known and understood but perhaps not always addressed. This impact is of particular interest for beamlines operating below ~150 eV and it becomes severe for energies below 40-60 eV, depending on the beamline’s optical layout. The Bloch beamline at MAXIV Laboratory is designed for...
