Speaker
Description
This lecture will introduce how X-ray and low-energy electron microscopy can be used to investigate the surface structure, chemical composition, and electronic properties of materials. With a particular focus on SPELEEM microscopy at the Nanospectroscopy beamline of Elettra Sincrotrone Trieste, the talk will present how different measurement modes provide complementary information on materials and surfaces. Using examples from real experiments, I will show how these techniques allow us to make hidden features visible, compare different regions of a sample, and connect what we observe in an image with the underlying properties of the material. The lecture will give participants an inside view of how scientists explore materials in practice and how fundamental concepts from physics and chemistry are transformed into practical tools for investigating real-world materials.