Speaker
Alessandra Gianoncelli
(Elettra Sincrotrone Trieste S.C.p.A.)
Description
Low energy X-ray Fluorescence (XRF) microscopy is becoming a more and more widespread analytical tool, especially when combined with other imaging techniques such as Scanning Transmission X-ray microscopy, XANES or even with hard X-ray XRF.
While the first ones can be implemented in the same synchrotron end-station, the latter requires different optics and design not only for the end-station itself but also for the entire beamline.
The presentation aims at highlighting the advantages but also the challenges of implementing soft and hard XRF microscopes in the same synchrotron facility where XRF expertise can be easily shared. Examples of possible common scientific cases and results will be presented and discussed.
Primary author
Alessandra Gianoncelli
(Elettra Sincrotrone Trieste S.C.p.A.)
