Speaker
Silvano Bassanese
(Elettra Sincrotrone Trieste S.C.p.A.)
Description
Three dedicated beamlines for accelerator diagnostics are under discussion for Elettra 2.0. Two of them will be dedicated to measuring the transverse dimensions of the beam, using the X-ray pinhole camera technique with bending magnets as the source. A third line could transport visible-near UV radiation to a streak camera for the analysis of the longitudinal profile of the beam.
In this presentation we provide a general description of the first beamline to be constructed (XDBL1), dedicated to the measurement of the beam size from a non-dispersive source and aimed at the measurement of the beam emittance.
Authors
Marco Veronese
Silvano Bassanese
(Elettra Sincrotrone Trieste S.C.p.A.)