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Our beam size monitor employs π-polarized visible light and Fresnel zone plates (FZPs). There was an intriguing discrepancy during early commissioning between the two techniques. Beam size measurements using visible light matched expectations, while those obtained with FZPs were significantly larger. Interestingly, the FZP-measured beam size gradually decreased with accumulated beam dose.
I...
Three dedicated beamlines for accelerator diagnostics are under discussion for Elettra 2.0. Two of them will be dedicated to measuring the transverse dimensions of the beam, using the X-ray pinhole camera technique with bending magnets as the source. A third line could transport visible-near UV radiation to a streak camera for the analysis of the longitudinal profile of the beam.
In this...
In order to improve our transverse diagnostic tools, two new pinhole beamlines will be designed. The pinhole arrays will be in air for easier maintenance: this will result in a significant loss of X-Ray photons when passing through the vacuum window. To overcome this issue, the option to directly illuminate a CCD/CMOS camera with X-Ray radiation without prior conversion into visible light is...
For the Elettra 2.0 X-ray pinhole camera (XPC) on beamline XDBL1, we are aiming for pinholes as small as 10 microns. In literature, the technological details of pinhole design are not discussed in great detail. The aim of this discussion is to gather and share experience on the optimal choice of pinhole technology. Starting from the main design concept of a stack of tungsten plates with...
