Speaker
Description
Recent advances in computational imaging are reshaping ultrafast measurement, making it possible to recover information that is difficult or impossible to access with conventional imaging or pump–probe approaches alone. In this talk, I discuss progress over the past five years at the intersection of computational microscopy, electric-field metrology, and algorithm development, with an emphasis on how ptychographic and related computational methods can turn intensity measurements into quantitative reconstructions of ultrafast fields and transient material response.
I highlight approaches for complete pulse-beam characterization, single-shot, and three-dimensional imaging, and the study of plasma and carrier dynamics on ultrafast timescales. Examples include broadband scanning ptychography, single-shot ptychography, electron–neutral deconvolution in plasmas, three-dimensional single-shot ptychography, and applications ranging from two-photon-absorption-induced carrier dynamics in ZnSe to laser-induced and electrostatic-discharge plasma imaging. Taken together, these results illustrate how computational imaging can expand the dimensionality, fidelity, and physical interpretability of ultrafast experiments.