Speaker
Description
The customization of Low-Gain Avalanche Diode (LGAD) sensors, originally developed for high-energy physics, to detect soft X-rays promises significant performance improvements over state-of-the-art low-energy detectors in terms of sensitivity, speed, and radiation hardness. By combining the intrinsic internal gain of LGADs with a thin entrance window optimized for high quantum efficiency, these sensors enable performance in the soft X-ray and UV energy range comparable to that delivered by hard X-ray detectors.
This presentation will discuss the results obtained so far for soft X-ray ptychography and time-resolved Resonant Inelastic X-ray Scattering (RIXS) measurements. Moreover, perspectives for future LGAD technologies will be explored, along with potential detector systems achieved by pairing LGADs with readout electronics conventionally used for hard X-rays.